Automatic Test Line

См. также в других словарях:

• Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

• Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

• Automatic number identification — (ANI) is a feature of telephony intelligent network services that permits subscribers to display or capture the telephone numbers of calling parties. In the United States it is part of Inward Wide Area Telephone Service (WATS). The ANI service… …   Wikipedia

• Automatic Message Accounting — (AMA) provides detail billing for telephone calls. When Direct Distance Dialing (DDD) was introduced in the USA, message registers no longer sufficed for dialed telephone calls. The need to record the time and phone number of each long distance… …   Wikipedia

• Automatic dependent surveillance-broadcast — (ADS B) is a cooperative surveillance technique for air traffic control and related applications. An ADS B out equipped aircraft determines its own position using a global navigation satellite system and periodically broadcasts this position and… …   Wikipedia

• Automatic number announcement circuit — An automatic number announcement circuit (ANAC) is a special telephone number that is meant to be used by phone company technicians and other telecommunications technicians to determine the phone number of a particular line. The way an ANAC works …   Wikipedia

• Automatic transmission — An automatic transmission (commonly AT or Auto ) is an automobile gearbox that can change gear ratios automatically as the vehicle moves, freeing the driver from having to shift gears manually. Similar but larger devices are also used for heavy… …   Wikipedia

• Back-end of line — Die Mikroelektronik ist ein Teilgebiet der Elektrotechnik bzw. der Elektronik, das sich mit der Miniaturisierung von elektronischen Schaltungen befasst …   Deutsch Wikipedia

• Front-end of line — Die Mikroelektronik ist ein Teilgebiet der Elektrotechnik bzw. der Elektronik, das sich mit der Miniaturisierung von elektronischen Schaltungen befasst …   Deutsch Wikipedia

• Multi-site test — Multi site test, or multisite test , or concurrent test , or parallel test are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple devices at the same time. Currently, devices refer to System on a… …   Wikipedia

• Device under test — (DUT), also known as unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing. In semiconductor testing In semiconductor testing, DUT refers to a specific die on a wafer or the resulting packaged part.… …   Wikipedia